JPH0427507B2 - - Google Patents

Info

Publication number
JPH0427507B2
JPH0427507B2 JP56123421A JP12342181A JPH0427507B2 JP H0427507 B2 JPH0427507 B2 JP H0427507B2 JP 56123421 A JP56123421 A JP 56123421A JP 12342181 A JP12342181 A JP 12342181A JP H0427507 B2 JPH0427507 B2 JP H0427507B2
Authority
JP
Japan
Prior art keywords
package
insulating plate
lead terminal
spring pin
floating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56123421A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5824871A (ja
Inventor
Ichiro Midorikawa
Masaru Tateishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56123421A priority Critical patent/JPS5824871A/ja
Publication of JPS5824871A publication Critical patent/JPS5824871A/ja
Publication of JPH0427507B2 publication Critical patent/JPH0427507B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56123421A 1981-08-06 1981-08-06 半導体パッケ−ジ測定治具 Granted JPS5824871A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56123421A JPS5824871A (ja) 1981-08-06 1981-08-06 半導体パッケ−ジ測定治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56123421A JPS5824871A (ja) 1981-08-06 1981-08-06 半導体パッケ−ジ測定治具

Publications (2)

Publication Number Publication Date
JPS5824871A JPS5824871A (ja) 1983-02-14
JPH0427507B2 true JPH0427507B2 (en]) 1992-05-12

Family

ID=14860131

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56123421A Granted JPS5824871A (ja) 1981-08-06 1981-08-06 半導体パッケ−ジ測定治具

Country Status (1)

Country Link
JP (1) JPS5824871A (en])

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6258780U (en]) * 1985-09-30 1987-04-11
JPS6258778U (en]) * 1985-09-30 1987-04-11
JPS6258779U (en]) * 1985-09-30 1987-04-11
JPH0310273U (en]) * 1989-06-15 1991-01-31
JPH05209933A (ja) * 1992-01-29 1993-08-20 Nec Corp 被測定物位置出し機構付きコンタクタおよびそれを用いた自動選別装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54119667U (en]) * 1978-02-10 1979-08-22

Also Published As

Publication number Publication date
JPS5824871A (ja) 1983-02-14

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